The calculation of reflections at low angles is an essential component of multiple procedures that involve compounds with extensive structural properties. These compounds have gained attention within ...

X-ray diffraction (XRD) is a powerful non-destructive analytical technique used to evaluate crystalline materials and determine their structural properties. As one of the most widely used ...

Diffractometers have been around for a long time and are used to analyze various types of materials and provide information regarding their structure. While there are a few different types, we’re ...

We present a cost-effective focus monitoring technique based on the illumination and the target co-optimization. An advanced immersion scanner can provide the freeform illumination that enables the ...