The H105 ProScan Microscope stage from Prior Scientific is purpose designed for precision mapping of large specimens including scanning of a wide range of semiconductor wafers (up to 150mm / 6 inches) ...

At its core, SPM operates on the principle of measuring interactions between a sharp probe and the surface of a material. As the probe scans across the surface, it detects variations in physical ...

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PI is well-known for its piezo-based high-speed nanopositioning and scanning systems designed to improve super-resolution microscopy results. The latest piezo-driven nano focusing stage for microscope ...

(Nanowerk News) Global piezo nanopositioning leader PI introduces a new microscope stage family designed for democratizing the advantages of ultrasonic piezo motor drive systems in super-resolution ...

Atomic force microscopy, or AFM, is a widely used technique that can quantitatively map material surfaces in three dimensions, but its accuracy is limited by the size of the microscope’s probe. A new ...

The development of organic light-emitting diode (OLED) visual display technologies harnesses the properties of two key techniques: photoluminescence and electroluminescence. Confocal microscopy can be ...

Researchers have developed a deep learning algorithm for removing systematic effects from atomic force microscopy images, enabling more precise profiles of material surfaces. Atomic force microscopy, ...