Metrology and wafer inspection processes are changing to keep up with evolving and new device applications. While fab floors still have plenty of OCD tools, ellipsometers, and CD-SEMs, new systems are ...

Metrology serves as the cornerstone of modern industry, providing the key standards by which we measure the world. Optical metrology, in particular, has historically leveraged the notion of ...

Celebrated each year on 20 May, World Metrology Day highlights the vital role of measurement science in our daily lives. From GPS navigation to medical doses and construction safety, metrology ensures ...

NAGOYA, Japan--(BUSINESS WIRE)--It was announced today that GaN (Gallium Nitride)-based e-Beam inspection and metrology for advanced semiconductor manufacturing, jointly developed by Nagoya University ...

Onto Innovation Inc. (ONTO) recently augmented its award-winning Atlas family with the introduction of the Atlas G6 optical critical dimension (OCD) metrology system. Designed specifically for the era ...

With it’s busiest annual conference yet, this year saw a focus on e-micromobility and its challenges, highlighting the need not only for regulation, but also enforcement, as well as a deep dive into ...